Evolving Metric Learning for Incremental and Decremental Features
- URL: http://arxiv.org/abs/2006.15334v2
- Date: Wed, 30 Jun 2021 03:21:14 GMT
- Title: Evolving Metric Learning for Incremental and Decremental Features
- Authors: Jiahua Dong, Yang Cong, Gan Sun, Tao Zhang, Xu Tang and Xiaowei Xu
- Abstract summary: We develop a new online Evolving Metric Learning model for incremental and decremental features.
Our model can handle the instance and feature evolutions simultaneously by incorporating with a smoothed Wasserstein metric distance.
In addition to tackling the challenges in one-shot case, we also extend our model into multishot scenario.
- Score: 45.696514400861275
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: Online metric learning has been widely exploited for large-scale data
classification due to the low computational cost. However, amongst online
practical scenarios where the features are evolving (e.g., some features are
vanished and some new features are augmented), most metric learning models
cannot be successfully applied to these scenarios, although they can tackle the
evolving instances efficiently. To address the challenge, we develop a new
online Evolving Metric Learning (EML) model for incremental and decremental
features, which can handle the instance and feature evolutions simultaneously
by incorporating with a smoothed Wasserstein metric distance. Specifically, our
model contains two essential stages: a Transforming stage (T-stage) and a
Inheriting stage (I-stage). For the T-stage, we propose to extract important
information from vanished features while neglecting non-informative knowledge,
and forward it into survived features by transforming them into a low-rank
discriminative metric space. It further explores the intrinsic low-rank
structure of heterogeneous samples to reduce the computation and memory burden
especially for highly-dimensional large-scale data. For the I-stage, we inherit
the metric performance of survived features from the T-stage and then expand to
include the new augmented features. Moreover, a smoothed Wasserstein distance
is utilized to characterize the similarity relationships among the
heterogeneous and complex samples, since the evolving features are not strictly
aligned in the different stages. In addition to tackling the challenges in
one-shot case, we also extend our model into multishot scenario. After deriving
an efficient optimization strategy for both T-stage and I-stage, extensive
experiments on several datasets verify the superior performance of our EML
model.
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