Cryogenic single-port calibration for superconducting microwave resonator measurements

• URL: http://arxiv.org/abs/2103.01491v1
• Date: Tue, 2 Mar 2021 06:24:51 GMT
• Title: Cryogenic single-port calibration for superconducting microwave resonator measurements
• Authors: Haozhi Wang, S. Singh, C.R.H. McRae, J.C. Bardin, S.-X. Lin, N. Messaoudi, A.R. Castelli, Y.J. Rosen, E.T. Holland, D.P. Pappas, J.Y. Mutus
• Abstract summary: In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer (VNA) We cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.
• Score: 0.0
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer (VNA) with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.

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