A parameter refinement method for Ptychography based on Deep Learning concepts

• URL: http://arxiv.org/abs/2105.08058v1
• Date: Tue, 18 May 2021 10:15:17 GMT
• Title: A parameter refinement method for Ptychography based on Deep Learning concepts
• Authors: Francesco Guzzi, George Kourousias, Fulvio Bill\`e, Roberto Pugliese, Alessandra Gianoncelli and Sergio Carrato
• Abstract summary: coarse parametrisation in propagation distance, position errors and partial coherence frequently menaces the experiment viability. A modern Deep Learning framework is used to correct autonomously the setup incoherences, thus improving the quality of a ptychography reconstruction. We tested our system on both synthetic datasets and also on real data acquired at the TwinMic beamline of the Elettra synchrotron facility.
• Score: 55.41644538483948
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: X-ray Ptychography is an advanced computational microscopy technique which is delivering exceptionally detailed quantitative imaging of biological and nanotechnology specimens. However coarse parametrisation in propagation distance, position errors and partial coherence frequently menaces the experiment viability. In this work we formally introduced these actors, solving the whole reconstruction as an optimisation problem. A modern Deep Learning framework is used to correct autonomously the setup incoherences, thus improving the quality of a ptychography reconstruction. Automatic procedures are indeed crucial to reduce the time for a reliable analysis, which has a significant impact on all the fields that use this kind of microscopy. We implemented our algorithm in our software framework, SciComPty, releasing it as open-source. We tested our system on both synthetic datasets and also on real data acquired at the TwinMic beamline of the Elettra synchrotron facility.

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