A compact and versatile cryogenic probe station for quantum device testing

• URL: http://arxiv.org/abs/2212.12369v1
• Date: Fri, 23 Dec 2022 14:44:09 GMT
• Title: A compact and versatile cryogenic probe station for quantum device testing
• Authors: Mathieu de Kruijf, Simon Geyer, Toni Berger, Matthias Mergenthaler, Floris Braakman, Richard J. Warburton, and Andreas V. Kuhlmann
• Abstract summary: We present a probe station that can be operated from room temperature down to below 2$,$K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for quantum dot spin qubits.
• Score: 0.0
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: Fast feedback from cryogenic electrical characterization measurements is key for the development of scalable quantum computing technology. At room temperature, high-throughput device testing is accomplished with a probe-based solution, where electrical probes are repeatedly positioned onto devices for acquiring statistical data. In this work we present a probe station that can be operated from room temperature down to below 2$\,$K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. A large variety of electronic devices can be tested. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for quantum dot spin qubits. Such a tool can massively accelerate the design-fabrication-measurement cycle and provide important feedback for process optimization towards building scalable quantum circuits.

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