SCL-VI: Self-supervised Context Learning for Visual Inspection of Industrial Defects

• URL: http://arxiv.org/abs/2311.06504v2
• Date: Tue, 21 Nov 2023 14:57:09 GMT
• Title: SCL-VI: Self-supervised Context Learning for Visual Inspection of Industrial Defects
• Authors: Peng Wang, Haiming Yao, Wenyong Yu
• Abstract summary: We present a novel self-supervised learning algorithm designed to derive an optimal encoder by tackling the renowned jigsaw puzzle. Our approach involves dividing the target image into nine patches, tasking the encoder with predicting the relative position relationships between any two patches to extract rich semantics.
• Score: 4.487908181569429
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and object defects, lacking the capacity to discern latent representations and intricate features. In this paper, we present a novel self-supervised learning algorithm designed to derive an optimal encoder by tackling the renowned jigsaw puzzle. Our approach involves dividing the target image into nine patches, tasking the encoder with predicting the relative position relationships between any two patches to extract rich semantics. Subsequently, we introduce an affinity-augmentation method to accentuate differences between normal and abnormal latent representations. Leveraging the classic support vector data description algorithm yields final detection results. Experimental outcomes demonstrate that our proposed method achieves outstanding detection and segmentation performance on the widely used MVTec AD dataset, with rates of 95.8% and 96.8%, respectively, establishing a state-of-the-art benchmark for both texture and object defects. Comprehensive experimentation underscores the effectiveness of our approach in diverse industrial applications.

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