Anti Kibble-Zurek behavior in the quantum XY spin-1/2 chain driven by correlated noisy magnetic field and anisotropy
- URL: http://arxiv.org/abs/2503.03409v2
- Date: Thu, 20 Mar 2025 17:56:41 GMT
- Title: Anti Kibble-Zurek behavior in the quantum XY spin-1/2 chain driven by correlated noisy magnetic field and anisotropy
- Authors: S. Sadeghizade, R. Jafari, A. Langari,
- Abstract summary: In the non-adiabatic dynamics across a quantum phase transition, the Kibble-Zurek paradigm describes that the average number of topological defects is suppressed as a universal power law with the quench time scale.<n>Here, we study the defect generation in the driven transverse field/anisotropy quantum $XY$ model in the presence of a correlated (colored) noise.
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- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: In the non-adiabatic dynamics across a quantum phase transition, the Kibble-Zurek paradigm describes that the average number of topological defects is suppressed as a universal power law with the quench time scale. A conflicting observation, which termed anti-Kibble-Zurek dynamics has been reported in several studies, specifically in the driven systems with an uncorrelated stochastic (white) noise. Here, we study the defect generation in the driven transverse field/anisotropy quantum $XY$ model in the presence of a correlated (colored) Gaussian noise. We propose a generic conjecture that properly capture the noise-induced excitation features, which shows good agreement with the numerical simulations. We show that, the dynamical features of defect density are modified by varying the noise correlation time. Our numerical simulations confirm that, for fast noises, the dynamics of the defect density is the same as that of the uncorrelated (white) noise, as is expected. However, the larger ratio of noise correlation time to the annealing time results in larger defects density formation and reforms the universal dynamical features. Our finding reveals that, the noise-induced defects scale linearly with the annealing time for fast noises, while in the presence of the slow noises, the noise-induced defects scale linearly with the square of the annealing time. The numerical simulations confirm that, the optimal annealing time, at which the defects density is minimum, scales linearly in logarithmic scale with the total noise power having different exponents for the fast and slow noises.
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