Application of Machine Learning for Correcting Defect-induced Neuromorphic Circuit Inference Errors

• URL: http://arxiv.org/abs/2509.11113v1
• Date: Sun, 14 Sep 2025 06:05:27 GMT
• Title: Application of Machine Learning for Correcting Defect-induced Neuromorphic Circuit Inference Errors
• Authors: Vedant Sawal, Hiu Yung Wong,
• Abstract summary: This paper presents a machine learning-based approach to correct inference errors caused by stuck-at faults in ReRAM-based neuromorphic circuits.<n>Using a Design-Technology Co-Optimization (DTCO) simulation framework, we model and analyze six spatial defect types.<n>We demonstrate that the proposed correction method, which employs a lightweight neural network trained on the circuit's output voltages, can recover up to 35% (from 55% to 90%) inference accuracy loss in defective scenarios.
• Score: 0.0
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: This paper presents a machine learning-based approach to correct inference errors caused by stuck-at faults in fully analog ReRAM-based neuromorphic circuits. Using a Design-Technology Co-Optimization (DTCO) simulation framework, we model and analyze six spatial defect types-circular, circular-complement, ring, row, column, and checkerboard-across multiple layers of a multi-array neuromorphic architecture. We demonstrate that the proposed correction method, which employs a lightweight neural network trained on the circuit's output voltages, can recover up to 35% (from 55% to 90%) inference accuracy loss in defective scenarios. Our results, based on handwritten digit recognition tasks, show that even small corrective networks can significantly improve circuit robustness. This method offers a scalable and energy-efficient path toward enhanced yield and reliability for neuromorphic systems in edge and internet-of-things (IoTs) applications. In addition to correcting the specific defect types used during training, our method also demonstrates the ability to generalize-achieving reasonable accuracy when tested on different types of defects not seen during training. The framework can be readily extended to support real-time adaptive learning, enabling on-chip correction for dynamic or aging-induced fault profiles.

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