Machine Learning Pipeline for Segmentation and Defect Identification
from High Resolution Transmission Electron Microscopy Data
- URL: http://arxiv.org/abs/2001.05022v2
- Date: Tue, 23 Feb 2021 23:30:56 GMT
- Title: Machine Learning Pipeline for Segmentation and Defect Identification
from High Resolution Transmission Electron Microscopy Data
- Authors: C.K. Groschner, Christina Choi, and M.C. Scott
- Abstract summary: We demonstrate a flexible two step pipeline for analysis of high resolution transmission electron microscopy data.
Our trained U-Net is able to segment nanoparticles from amorphous background with a Dice coefficient of 0.8.
We are then able to classify whether nanoparticles contain a visible stacking fault with 86% accuracy.
- Score: 0.0
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: In the field of transmission electron microscopy, data interpretation often
lags behind acquisition methods, as image processing methods often have to be
manually tailored to individual datasets. Machine learning offers a promising
approach for fast, accurate analysis of electron microscopy data. Here, we
demonstrate a flexible two step pipeline for analysis of high resolution
transmission electron microscopy data, which uses a U-Net for segmentation
followed by a random forest for detection of stacking faults. Our trained U-Net
is able to segment nanoparticle regions from amorphous background with a Dice
coefficient of 0.8 and significantly outperforms traditional image segmentation
methods. Using these segmented regions, we are then able to classify whether
nanoparticles contain a visible stacking fault with 86% accuracy. We provide
this adaptable pipeline as an open source tool for the community. The combined
output of the segmentation network and classifier offer a way to determine
statistical distributions of features of interest, such as size, shape and
defect presence, enabling detection of correlations between these features.
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