Charge noise and overdrive errors in reflectometry-based charge, spin and Majorana qubit readout

• URL: http://arxiv.org/abs/2006.12391v1
• Date: Mon, 22 Jun 2020 16:19:03 GMT
• Title: Charge noise and overdrive errors in reflectometry-based charge, spin and Majorana qubit readout
• Authors: Vahid Derakhshan Maman, M. F. Gonzalez-Zalba, Andr\'as P\'alyi
• Abstract summary: We discuss charge qubits, singlet-triplet spin qubits, and Majorana qubits. In our model, we account for readout errors due to slow charge noise, and due to overdriving, when a too strong probe is causing errors.
• Score: 0.0
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: Solid-state qubits incorporating quantum dots can be read out by gate reflectometry. Here, we theoretically describe physical mechanisms that render such reflectometry-based readout schemes imperfect. We discuss charge qubits, singlet-triplet spin qubits, and Majorana qubits. In our model, we account for readout errors due to slow charge noise, and due to overdriving, when a too strong probe is causing errors. A key result is that for charge and spin qubits, the readout fidelity saturates at large probe strengths, whereas for Majorana qubits, there is an optimal probe strength which provides a maximized readout fidelity. We also point out the existence of severe readout errors appearing in a resonance-like fashion as the pulse strength is increased, and show that these errors are related to probe-induced multi-photon transitions. Besides providing practical guidelines toward optimized readout, our study might also inspire ways to use gate reflectometry for device characterization.

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