Computer Vision and Normalizing Flow Based Defect Detection
- URL: http://arxiv.org/abs/2012.06737v1
- Date: Sat, 12 Dec 2020 05:38:21 GMT
- Title: Computer Vision and Normalizing Flow Based Defect Detection
- Authors: Zijian Kuang and Xinran Tie
- Abstract summary: We present a two-stage defect detection network based on the object detection model YOLO, and the normalizing flow-based defect detection model DifferNet.
Our model has high robustness and performance on defect detection using real-world video clips taken from a production line monitoring system.
Our proposed model can learn on a small number of defect-free samples of single or multiple product types.
- Score: 0.0
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: Surface defect detection is essential and necessary for controlling the
qualities of the products during manufacturing. The challenges in this complex
task include: 1) collecting defective samples and manually labeling for
training is time-consuming; 2) the defects' characteristics are difficult to
define as new types of defect can happen all the time; 3) and the real-world
product images contain lots of background noise. In this paper, we present a
two-stage defect detection network based on the object detection model YOLO,
and the normalizing flow-based defect detection model DifferNet. Our model has
high robustness and performance on defect detection using real-world video
clips taken from a production line monitoring system. The normalizing
flow-based anomaly detection model only requires a small number of good samples
for training and then perform defect detection on the product images detected
by YOLO. The model we invent employs two novel strategies: 1) a two-stage
network using YOLO and a normalizing flow-based model to perform product defect
detection, 2) multi-scale image transformations are implemented to solve the
issue product image cropped by YOLO includes many background noise. Besides,
extensive experiments are conducted on a new dataset collected from the
real-world factory production line. We demonstrate that our proposed model can
learn on a small number of defect-free samples of single or multiple product
types. The dataset will also be made public to encourage further studies and
research in surface defect detection.
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