Deep Metric Learning for Few-Shot Image Classification: A Selective
Review
- URL: http://arxiv.org/abs/2105.08149v1
- Date: Mon, 17 May 2021 20:27:59 GMT
- Title: Deep Metric Learning for Few-Shot Image Classification: A Selective
Review
- Authors: Xiaoxu Li, Xiaochen Yang, Zhanyu Ma, Jing-Hao Xue
- Abstract summary: Few-shot image classification is a challenging problem which aims to achieve the human level of recognition based only on a small number of images.
Deep learning algorithms such as meta-learning, transfer learning, and metric learning have been employed recently and achieved the state-of-the-art performance.
- Score: 38.71276383292809
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: Few-shot image classification is a challenging problem which aims to achieve
the human level of recognition based only on a small number of images. Deep
learning algorithms such as meta-learning, transfer learning, and metric
learning have been employed recently and achieved the state-of-the-art
performance. In this survey, we review representative deep metric learning
methods for few-shot classification, and categorize them into three groups
according to the major problems and novelties they focus on. We conclude this
review with a discussion on current challenges and future trends in few-shot
image classification.
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