Dielectric Loss due to Charged-Defect Acoustic Phonon Emission
- URL: http://arxiv.org/abs/2402.17291v1
- Date: Tue, 27 Feb 2024 08:10:18 GMT
- Title: Dielectric Loss due to Charged-Defect Acoustic Phonon Emission
- Authors: Mark E. Turiansky and Chris G. Van de Walle
- Abstract summary: Loss per defect depends mainly on properties of the host material.
Diamond, cubic BN, AlN, and SiC are optimal in this respect.
- Score: 0.0
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: The coherence times of state-of-the-art superconducting qubits are limited by
bulk dielectric loss, yet the microscopic mechanism leading to this loss is
unclear. Here we propose that the experimentally observed loss can be
attributed to the presence of charged defects that enable the absorption of
electromagnetic radiation by the emission of acoustic phonons. Our explicit
derivation of the absorption coefficient for this mechanism allows us to derive
a loss tangent of $7.2 \times 10^{-9}$ for Al$_2$O$_3$, in good agreement with
recent high-precision measurements [A. P. Read et al., Phys. Rev. Appl. 19,
034064 (2023)]. We also find that for temperatures well below ~0.2 K, the loss
should be independent of temperature, also in agreement with observations. Our
investigations show that the loss per defect depends mainly on properties of
the host material, and a high-throughput search suggests that diamond, cubic
BN, AlN, and SiC are optimal in this respect.
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