Imaging of electrical signals in a quantum SiC microscope
- URL: http://arxiv.org/abs/2509.14888v1
- Date: Thu, 18 Sep 2025 12:10:04 GMT
- Title: Imaging of electrical signals in a quantum SiC microscope
- Authors: A. Suhana, T. A. U. Svetikova, C. Schneider, M. Helm, A. N. Anisimov, G. V. Astakhov,
- Abstract summary: We report the experimental realization of a quantum silicon carbide microscope (QSiCM) and demonstrate its functionality by imaging magnetic fields generated by electrical currents.<n>We employ a dual-frequency sensing protocol to enhance the readout contrast and suppress noise arising from strain and temperature fluctuations.<n>This approach enables spatial imaging of current-induced magnetic fields with a field of view of $50 times 50 $ virtual pixels, temporal resolution of $50,mathrmms$, spatial resolution of $30,mathrmmu m$ and sensitivity of about $2,mathrmmu T
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- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: We report the experimental realization of a quantum silicon carbide microscope (QSiCM) and demonstrate its functionality by imaging magnetic fields generated by electrical currents. We employ a dual-frequency sensing protocol to enhance the readout contrast and suppress noise arising from strain and temperature fluctuations. This approach enables spatial imaging of current-induced magnetic fields with a field of view of $50 \times 50 $ virtual pixels, temporal resolution of $50\,\mathrm{ms}$, spatial resolution of $30\,\mathrm{\mu m}$ and sensitivity of about $2\,\mathrm{\mu T \, Hz^{-1/2}}$ per pixel. Further sensitivity enhancement is anticipated through the use of isotopically purified SiC and improved light collection in crystallographically optimized wafer orientations. In addition, we implement a microwave-free imaging protocol based on spin level anticrossing, offering simplified operation with enhanced sensitivity. The demonstrated platform is compatible with commercial, wafer-scale fabrication and holds strong potential for applications in biomedical imaging and diagnostics, as well as non-invasive current and temperature mapping in high-power electronic devices.
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