Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
- URL: http://arxiv.org/abs/2605.26468v1
- Date: Tue, 26 May 2026 02:24:44 GMT
- Title: Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
- Abstract summary: We propose the first unsupervised anomaly detection framework incorporating a Diffusion Transformer.<n>Anomaly scores are derived from the noise-prediction error over mid-range diffusion timesteps.<n>Our approach achieves state-of-the-art performance on industrial 16nm IC test data under extreme class imbalance.
- Score: 6.4155075067452385
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detection framework incorporating a Diffusion Transformer. Raw test measurements are first compressed by an autoencoder, then reshaped into a structured token sequence enriched with sinusoidal and per-device wafer-position embeddings. Anomaly scores are derived from the noise-prediction error over mid-range diffusion timesteps, enabling fast wafer-scale screening without any labeled defects or manual feature engineering. Our approach achieves state-of-the-art performance on industrial 16nm IC test data under extreme class imbalance, offering interpretable failure localization through latent-space reconstruction residuals.
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