Vapor-cell-based atomic electrometry for detection frequencies below kHz
- URL: http://arxiv.org/abs/2002.04145v2
- Date: Mon, 17 Feb 2020 18:40:57 GMT
- Title: Vapor-cell-based atomic electrometry for detection frequencies below kHz
- Authors: Yuan-Yu Jau and Tony Carter
- Abstract summary: Rydberg-assisted atomic electrometry using alkali-metal atoms contained inside a vacuum environment for detecting external electric fields (E-fields) at $$ a few kHz has been quite challenging.
We report a very slow E-field screening phenomenon with a time scale up to $sim$ second on a rubidium (Rb) vapor cell that is made of monocrystalline sapphire.
Using this sapphire-made Rb vapor cell with optically induced, internal bias E-field, we demonstrate vapor-cell-based, low-frequency atomic electrometry that responds to the E-field strength linearly
- Score: 0.0
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: Rydberg-assisted atomic electrometry using alkali-metal atoms contained
inside a vacuum environment for detecting external electric fields (E-fields)
at frequencies $<$ a few kHz has been quite challenging due to the
low-frequency E-field screening effect that is caused by the alkali-metal atoms
adsorbed on the inner surface of the container. We report a very slow E-field
screening phenomenon with a time scale up to $\sim$ second on a rubidium (Rb)
vapor cell that is made of monocrystalline sapphire. Using this sapphire-made
Rb vapor cell with optically induced, internal bias E-field, we demonstrate
vapor-cell-based, low-frequency atomic electrometry that responds to the
E-field strength linearly. Limited by the given experimental conditions, this
demonstrated atomic electrometer uses an active volume of 11 mm$^3$ and
delivers a spectral noise floor around $0.34$ (mV/m)/$\sqrt{\rm Hz}$ and the
3-dB low cut-off frequency around 770 Hz inside the vapor cell. This work
investigates a regime of vapor-cell-based atomic electrometry that was seldom
studied before, which may enable more applications that utilize atomic E-field
sensing technology.
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