High-fidelity single-shot readout of single electron spin in diamond with spin-to-charge conversion

• URL: http://arxiv.org/abs/2009.14172v1
• Date: Tue, 29 Sep 2020 17:36:15 GMT
• Title: High-fidelity single-shot readout of single electron spin in diamond with spin-to-charge conversion
• Authors: Qi Zhang, Yuhang Guo, Wentao Ji, Mengqi Wang, Jun Yin, Fei Kong, Yiheng Lin, Chunming Yin, Fazhan Shi, Ya Wang, Jiangfeng Du
• Abstract summary: High fidelity single-shot readout of qubits is crucial component for fault-tolerant quantum computing and scalable quantum networks. Here, we introduce a spin-to-charge conversion method assisted by near-infrared (NIR) light to suppress the spin-flip error. We achieve an overall fidelity $>$ 95% for the single-shot readout of an NV center electron spin in the presence of high strain and fast spin-flip process.
• Score: 18.95428886889441
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: High fidelity single-shot readout of qubits is a crucial component for fault-tolerant quantum computing and scalable quantum networks. In recent years, the nitrogen-vacancy (NV) center in diamond has risen as a leading platform for the above applications. The current single-shot readout of the NV electron spin relies on resonance fluorescence method at cryogenic temperature. However, the the spin-flip process interrupts the optical cycling transition, therefore, limits the readout fidelity. Here, we introduce a spin-to-charge conversion method assisted by near-infrared (NIR) light to suppress the spin-flip error. This method leverages high spin-selectivity of cryogenic resonance excitation and high flexibility of photonionization. We achieve an overall fidelity $>$ 95% for the single-shot readout of an NV center electron spin in the presence of high strain and fast spin-flip process. With further improvements, this technique has the potential to achieve spin readout fidelity exceeding the fault-tolerant threshold, and may also find applications on integrated optoelectronic devices.

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