Scanning X-ray Diffraction Microscopy for Diamond Quantum Sensing
- URL: http://arxiv.org/abs/2103.08388v3
- Date: Fri, 14 Oct 2022 21:36:29 GMT
- Title: Scanning X-ray Diffraction Microscopy for Diamond Quantum Sensing
- Authors: Mason C. Marshall, David F. Phillips, Matthew J. Turner, Mark J.H. Ku,
Tao Zhou, Nazar Delegan, F. Joseph Heremans, Martin V. Holt, Ronald L.
Walsworth
- Abstract summary: Strain and its characterization present a challenge to diamond-based quantum sensing and information applications.
Here, we exploit nanofocused scanning X-ray diffraction microscopy to quantitatively measure crystal deformation from defects in diamond with high spatial and strain resolution.
Our results demonstrate both strain and spatial resolution sufficient for directional detection of dark matter via X-ray measurement of crystal strain.
- Score: 3.9300581209734102
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: Understanding nano- and micro-scale crystal strain in CVD diamond is crucial
to the advancement of diamond quantum technologies. In particular, the presence
of such strain and its characterization present a challenge to diamond-based
quantum sensing and information applications -- as well as for future dark
matter detectors where directional information of incoming particles is encoded
in crystal strain. Here, we exploit nanofocused scanning X-ray diffraction
microscopy to quantitatively measure crystal deformation from defects in
diamond with high spatial and strain resolution. Combining information from
multiple Bragg angles allows stereoscopic three-dimensional modeling of strain
feature geometry; the diffraction results are validated via comparison to
optical measurements of the strain tensor based on spin-state-dependent
spectroscopy of ensembles of nitrogen vacancy (NV) centers in the diamond. Our
results demonstrate both strain and spatial resolution sufficient for
directional detection of dark matter via X-ray measurement of crystal strain,
and provide a promising tool for diamond growth analysis and improvement of
defect-based sensing.
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