Multi defect detection and analysis of electron microscopy images with deep learning

• URL: http://arxiv.org/abs/2108.08883v1
• Date: Thu, 19 Aug 2021 19:16:24 GMT
• Title: Multi defect detection and analysis of electron microscopy images with deep learning
• Authors: Mingren Shen, Guanzhao Li, Dongxia Wu, Yuhan Liu, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Wei Li, Kevin Field, and Dane Morgan
• Abstract summary: We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis.
• Score: 5.3265578744942585
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.

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