Ten more times precision improved method for surface roughness
estimation with weak measurement
- URL: http://arxiv.org/abs/2202.13644v1
- Date: Mon, 28 Feb 2022 09:39:28 GMT
- Title: Ten more times precision improved method for surface roughness
estimation with weak measurement
- Authors: Hui-Chao Qu, Ya Xiao, Xin-Hong Han, Shan-Chuan Dong and Yong-Jian Gu
- Abstract summary: We propose two weak measurement schemes to estimate surface roughness through spectrum analysis and intensity analysis.
The precision and sensitivity of the light intensity analysis scheme achieve as high as 0.07 nm and 1/nm, respectively.
By introducing a modulated phase, we show that the sensitivity and precision achieved in our schemes can be effectively retained in a wider dynamic range.
- Score: 2.715899425311976
- License: http://creativecommons.org/licenses/by-nc-sa/4.0/
- Abstract: High-precision surface roughness estimation plays an important role in many
applications. However, the classical estimating methods are limited by shot
noise and only can achieve the precision of 0.1 nm with white light
interferometer. Here, we propose two weak measurement schemes to estimate
surface roughness through spectrum analysis and intensity analysis. The
estimating precision with spectrum analysis is about $10 ^{-5}$ nm by using a
currently available spectrometer with the resolution of $\Delta \lambda= 0.04$
pm and the corresponding sensitivity is better than 0.1 THz/nm. And the
precision and sensitivity of the light intensity analysis scheme achieve as
high as 0.07 nm and 1/nm, respectively. By introducing a modulated phase, we
show that the sensitivity and precision achieved in our schemes can be
effectively retained in a wider dynamic range. We further provide the
experimental design of the surface profiler based on our schemes. It
simultaneously meets the requirements of high precision, high sensitivity, and
wide measurement range, making it to be a promising practical tool.
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