Clear Memory-Augmented Auto-Encoder for Surface Defect Detection
- URL: http://arxiv.org/abs/2208.03879v1
- Date: Mon, 8 Aug 2022 02:39:03 GMT
- Title: Clear Memory-Augmented Auto-Encoder for Surface Defect Detection
- Authors: Wei Luo, Tongzhi Niu, Lixin Tang, Wenyong Yu, Bin Li
- Abstract summary: We propose a clear memory-augmented auto-encoder to repair abnormal foregrounds and preserve clear backgrounds.
A general artificial anomaly generation algorithm is proposed to simulate anomalies that are as realistic and feature-rich as possible.
At last, we propose a novel multi scale feature residual detection method for defect segmentation.
- Score: 10.829080460965478
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: In surface defect detection, due to the extreme imbalance in the number of
positive and negative samples, positive-samples-based anomaly detection methods
have received more and more attention. Specifically, reconstruction-based
methods are the most popular. However, exiting methods are either difficult to
repair abnormal foregrounds or reconstruct clear backgrounds. Therefore, we
propose a clear memory-augmented auto-encoder. At first, we propose a novel
clear memory-augmented module, which combines the encoding and memory-encoding
in a way of forgetting and inputting, thereby repairing abnormal foregrounds
and preservation clear backgrounds. Secondly, a general artificial anomaly
generation algorithm is proposed to simulate anomalies that are as realistic
and feature-rich as possible. At last, we propose a novel multi scale feature
residual detection method for defect segmentation, which makes the defect
location more accurate. CMA-AE conducts comparative experiments using 11
state-of-the-art methods on five benchmark datasets, showing an average 18.6%
average improvement in F1-measure.
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