Quantum Sensing with Scanning Near-Field Optical Photons Scattered by an Atomic-Force Microscope Tip

• URL: http://arxiv.org/abs/2212.04678v1
• Date: Fri, 9 Dec 2022 05:53:51 GMT
• Title: Quantum Sensing with Scanning Near-Field Optical Photons Scattered by an Atomic-Force Microscope Tip
• Authors: Soheil Khajavi, Zahra Shaterzadeh-Yazdi, Ali Eghrari, Mohammad Neshat
• Abstract summary: Scattering scanning near-field optical microscopy (s-SNOM) is known as a promising technique for overcoming Abbe diffraction limit. We propose a quantum model for the suggested system, by employing electric-dipole approximation, image theory, and perturbation theory. Our proposed scheme can be used for quantum imaging or quantum spectroscopy with high resolution.
• Score: 0.0
• License: http://creativecommons.org/licenses/by-nc-nd/4.0/
• Abstract: Scattering scanning near-field optical microscopy (s-SNOM) is known as a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic force microscope (AFM) tip to an optical electromagnetic (EM) field, while the tip is so close to a sample that the incident beam lies within the near-field regime and displays nonlinear behaviour. We suggest replacing the incident field by quantized EM fields, i.e. photons, and propose a quantum model for the suggested system, by employing electric-dipole approximation, image theory, and perturbation theory. Quantum state of scattered photons from the AFM tip is extracted from the proposed model, which contain information about electrical permittivity of the dielectric material beneath the tip. The permittivity of the sample can be extracted through spectroscopic setups. Our proposed scheme can be used for quantum imaging or quantum spectroscopy with high resolution.

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