Null device-independent prepare-and-prepare bipartite dimension test with a single joint measurement

• URL: http://arxiv.org/abs/2412.03197v1
• Date: Wed, 04 Dec 2024 10:37:09 GMT
• Title: Null device-independent prepare-and-prepare bipartite dimension test with a single joint measurement
• Authors: Josep Batle, Tomasz Białecki, Adam Bednorz,
• Abstract summary: We propose a device-independent dimensionality test with bipartite measurements and input from two separate parties, based on a null witness. The results demonstrate extreme precision of the test, which is able to detect disagreements with the qubit space of bipartite measurement.
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• Abstract: We propose a device-independent dimensionality test with bipartite measurements and input from two separate parties, based on a null witness. The dimension is determined from the rank of the matrix of measurements for pairs of states prepared by the parties. We have applied the test to various IBM Quantum devices. The results demonstrate extreme precision of the test, which is able to detect disagreements with the qubit (two-level) space of bipartite measurement even in the presence of technical imperfections. The deviations beyond 6 standard deviations have no simple origin and need urgent explanations to unblock progress in quantum computing.

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