Fast quantum interferometry at the nanometer and attosecond scales with energy-entangled photons
- URL: http://arxiv.org/abs/2505.15956v1
- Date: Wed, 21 May 2025 19:16:19 GMT
- Title: Fast quantum interferometry at the nanometer and attosecond scales with energy-entangled photons
- Authors: Colin P. Lualdi, Spencer J. Johnson, Michael Vayninger, Kristina A. Meier, Swetapadma Sahoo, Simeon I. Bogdanov, Paul G. Kwiat,
- Abstract summary: Two-photon interference is unaffected by loss and background, but nanometer-scale resolution is physically difficult to realize.<n>We enhance two-photon interference with highly non-degenerate energy entanglement featuring photon frequencies separated by 177 THz.<n>We observe measurement resolution at the nanometer (attosecond) scale with only $O(104)$ photon pairs, despite the presence of background and loss.
- Score: 0.0
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: In classical optical interferometry, loss and background complicate achieving fast nanometer-resolution measurements with illumination at low light levels. Conversely, quantum two-photon interference is unaffected by loss and background, but nanometer-scale resolution is physically difficult to realize. As a solution, we enhance two-photon interference with highly non-degenerate energy entanglement featuring photon frequencies separated by 177 THz. We observe measurement resolution at the nanometer (attosecond) scale with only $O(10^4)$ photon pairs, despite the presence of background and loss. Our non-destructive thickness measurement of a metallic thin film agrees with atomic force microscopy, which often achieves better resolution via destructive means. With contactless, non-destructive measurements in seconds or faster, our instrument enables metrological studies in optically challenging contexts where background, loss, or photosensitivity are factors.
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