Efficient learning of logical noise from syndrome data

• URL: http://arxiv.org/abs/2601.22286v1
• Date: Thu, 29 Jan 2026 20:02:00 GMT
• Title: Efficient learning of logical noise from syndrome data
• Authors: Han Zheng, Chia-Tung Chu, Senrui Chen, Argyris Giannisis Manes, Su-un Lee, Sisi Zhou, Liang Jiang,
• Abstract summary: We develop efficient estimators with provable guarantees on sample complexity and computational cost.<n>Our results establish syndrome-based learning as a practical approach to characterizing the logical channel in fault-tolerant quantum devices.
• Score: 1.2109342530966007
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: Characterizing errors in quantum circuits is essential for device calibration, yet detecting rare error events requires a large number of samples. This challenge is particularly severe in calibrating fault-tolerant, error-corrected circuits, where logical error probabilities are suppressed to higher order relative to physical noise and are therefore difficult to calibrate through direct logical measurements. Recently, Wagner et al. [PRL 130, 200601 (2023)] showed that, for phenomenological Pauli noise models, the logical channel can instead be inferred from syndrome measurement data generated during error correction. Here, we extend this framework to realistic circuit-level noise models. From a unified code-theoretic perspective and spacetime code formalism, we derive necessary and sufficient conditions for learning the logical channel from syndrome data alone and explicitly characterize the learnable degrees of freedom of circuit-level Pauli faults. Using Fourier analysis and compressed sensing, we develop efficient estimators with provable guarantees on sample complexity and computational cost. We further present an end-to-end protocol and demonstrate its performance on several syndrome-extraction circuits, achieving orders-of-magnitude sample-complexity savings over direct logical benchmarking. Our results establish syndrome-based learning as a practical approach to characterizing the logical channel in fault-tolerant quantum devices.

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