Characterizing Universal Gate Sets via Dihedral Benchmarking

• URL: http://arxiv.org/abs/1508.06312v3
• Date: Wed, 13 Aug 2025 17:36:02 GMT
• Title: Characterizing Universal Gate Sets via Dihedral Benchmarking
• Authors: Arnaud Carignan-Dugas, Joel J. Wallman, Joseph Emerson,
• Abstract summary: We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups.<n>Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition.
• Score: 0.0
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2) associated with arbitrarily small angle rotations. Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition. Combining this protocol with existing randomized benchmarking schemes enables an efficient means of characterizing universal gate sets for quantum information processing in a way that is independent of state-preparation and measurement errors. In particular, our protocol enables direct benchmarking of the $T$ gate (sometime called $\pi/8$-gate) even for the gate-dependent error model that is expected in leading approaches to fault-tolerant quantum computation.

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