Improving Semiconductor Device Modeling for Electronic Design Automation
by Machine Learning Techniques
- URL: http://arxiv.org/abs/2105.11453v2
- Date: Wed, 5 Apr 2023 08:20:32 GMT
- Title: Improving Semiconductor Device Modeling for Electronic Design Automation
by Machine Learning Techniques
- Authors: Zeheng Wang, Liang Li, Ross C. C. Leon, Jinlin Yang, Junjie Shi,
Timothy van der Laan, and Muhammad Usman
- Abstract summary: We propose a self-augmentation strategy for improving ML-based device modeling using variational autoencoder-based techniques.
To demonstrate the effectiveness of our approach, we apply it to a deep neural network-based prediction task for the Ohmic resistance value in Gallium Nitride devices.
- Score: 6.170514965470266
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: The semiconductors industry benefits greatly from the integration of Machine
Learning (ML)-based techniques in Technology Computer-Aided Design (TCAD)
methods. The performance of ML models however relies heavily on the quality and
quantity of training datasets. They can be particularly difficult to obtain in
the semiconductor industry due to the complexity and expense of the device
fabrication. In this paper, we propose a self-augmentation strategy for
improving ML-based device modeling using variational autoencoder-based
techniques. These techniques require a small number of experimental data points
and does not rely on TCAD tools. To demonstrate the effectiveness of our
approach, we apply it to a deep neural network-based prediction task for the
Ohmic resistance value in Gallium Nitride devices. A 70% reduction in mean
absolute error when predicting experimental results is achieved. The inherent
flexibility of our approach allows easy adaptation to various tasks, thus
making it highly relevant to many applications of the semiconductor industry.
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