Measurement-Induced Criticality is Tomographically Optimal
- URL: http://arxiv.org/abs/2308.01653v2
- Date: Mon, 25 Sep 2023 02:27:50 GMT
- Title: Measurement-Induced Criticality is Tomographically Optimal
- Authors: Ahmed A. Akhtar, Hong-Ye Hu, Yi-Zhuang You
- Abstract summary: We develop a shadow tomography protocol utilizing the randomized measurement scheme based on hybrid quantum circuits.
Unlike conventional protocols that perform all measurements by the end of unitary evolutions, our protocol allows measurements to occur at any spacetime position throughout the quantum evolution.
- Score: 0.0
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: We develop a classical shadow tomography protocol utilizing the randomized
measurement scheme based on hybrid quantum circuits, which consist of layers of
two-qubit random unitary gates mixed with single-qubit random projective
measurements. Unlike conventional protocols that perform all measurements by
the end of unitary evolutions, our protocol allows measurements to occur at any
spacetime position throughout the quantum evolution. We provide a universal
classical post-processing strategy to approximately reconstruct the original
quantum state from intermittent measurement outcomes given the corresponding
random circuit realizations over repeated experiments. We investigated the
sample complexity for estimating different observables at different measurement
rates of the hybrid quantum circuits. Our result shows that the sample
complexity has an optimal scaling at the critical measurement rate when the
hybrid circuit undergoes the measurement-induced transition.
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