Measuring a single atom's position with extreme sub-wavelength resolution and force measurements in the yoctonewton range
- URL: http://arxiv.org/abs/2407.18670v1
- Date: Fri, 26 Jul 2024 11:19:50 GMT
- Title: Measuring a single atom's position with extreme sub-wavelength resolution and force measurements in the yoctonewton range
- Authors: P. H. Huber, P. Barthel, Th. Sriarunothai, G. S. Giri, S. Wölk, Ch. Wunderlich,
- Abstract summary: The center-of-mass position of a single trapped atomic ion is measured and tracked in time with high precision.
Measurements of an electrostatic force on a single ion demonstrate a sensitivity of 2.2 $times$ 10$-23 textN/sqrttextHz$.
- Score: 0.0
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: The center-of-mass position of a single trapped atomic ion is measured and tracked in time with high precision. Employing a near-resonant radio frequency field of wavelength 2.37 cm and a static magnetic field gradient of 19 T/m, the spatial location of the ion is determined with an unprecedented wavelength-relative resolution of 5 $\times$ 10$^{-9}$, corresponding to an absolute precision of 0.12 nm. Measurements of an electrostatic force on a single ion demonstrate a sensitivity of 2.2 $\times$ 10$^{-23} ~\text{N}/\sqrt{\text{Hz}}$. The real-time measurement of an atom's position complements the well-established technique of scanning near-field radio frequency transmission microscopy and opens up a novel route to using this method with path breaking spatial and force resolution.
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