Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification

• URL: http://arxiv.org/abs/2411.19422v1
• Date: Fri, 29 Nov 2024 00:31:01 GMT
• Title: Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
• Authors: Abhishek Mishra, Suman Kumar, Anush Lingamoorthy, Anup Das, Nagarajan Kandasamy,
• Abstract summary: We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN)<n>Wafer2Spike achieves an average classification accuracy of 98% on the WM-811k wafer benchmark dataset.
• Score: 7.657546767077741
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: In integrated circuit design, the analysis of wafer map patterns is critical to improve yield and detect manufacturing issues. We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN), and demonstrate that a well-trained SNN achieves superior performance compared to deep neural network-based solutions. Wafer2Spike achieves an average classification accuracy of 98\% on the WM-811k wafer benchmark dataset. It is also superior to existing approaches for classifying defect patterns that are underrepresented in the original dataset. Wafer2Spike achieves this improved precision with great computational efficiency.

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