A Useful Metric for the NISQ Era: Qubit Error Probability and Its Role in Zero Noise Extrapolation
- URL: http://arxiv.org/abs/2503.10204v2
- Date: Fri, 04 Jul 2025 07:33:48 GMT
- Title: A Useful Metric for the NISQ Era: Qubit Error Probability and Its Role in Zero Noise Extrapolation
- Authors: Nahual Sobrino, Unai Aseginolaza, Joaquim Jornet-Somoza, Juan Borge,
- Abstract summary: We propose the qubit error probability (QEP), a device specific metric that combines relaxation, dephasing, gate, and measurement contributions into a single per qubit figure of merit computable before execution.<n>In regimes where the raw circuits exhibit a finite mean QEP, the method suppresses observable errors beyond those attainable with circuit depth scaled ZNE.<n>These results demonstrate that QEP serves as a transparent and efficient error metric, and that its integration into ZNE provides a practical route to reliability gains on current superconducting hardware.
- Score: 0.0
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: Accurate assessment and management of errors is indispensable for extracting useful results from noisy intermediate-scale quantum (NISQ) devices. In this work, we propose the qubit error probability (QEP), a device specific metric that combines relaxation, dephasing, gate, and measurement contributions into a single per qubit figure of merit computable before execution. Leveraging QEP as the control variable, we revisit zero noise extrapolation (ZNE) by adding pairs of controlled native two-qubit gates on all connected qubit pairs to generate circuits with successively larger mean QEP; the zero error limit is then approximated by a linear regression of the measured observable against those values. Benchmarking on IBM Quantum Heron processors, we apply QEP guided ZNE to first order Trotterized simulations of the two dimensional transverse field Ising model, chosen as a representative interacting many body system, involving up to 68 qubits and 15 Trotter steps. In regimes where the raw circuits exhibit a finite mean QEP, the method suppresses observable errors beyond those attainable with circuit depth scaled ZNE, while requiring only three noise scaled evaluations and no additional classical post processing. These results demonstrate that QEP serves as a transparent and efficient error metric, and that its integration into ZNE provides a practical route to reliability gains on current superconducting hardware, without the resource costs associated with full quantum error correction.
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