Heating of a trapped ion induced by dielectric materials
- URL: http://arxiv.org/abs/2103.13846v1
- Date: Thu, 25 Mar 2021 13:52:28 GMT
- Title: Heating of a trapped ion induced by dielectric materials
- Authors: Markus Teller, Dario A. Fioretto, Philip C. Holz, Philipp Schindler,
Viktor Messerer, Klemens Sch\"uppert, Yueyang Zou, Rainer Blatt, John
Chiaverini, Jeremy Sage, Tracy E. Northup
- Abstract summary: Electric-field noise due to surfaces disturbs the motion of nearby trapped ions.
We present a method that predicts the effect of dielectric materials on the ion's motion.
We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.
- Score: 1.2495977992702094
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: Electric-field noise due to surfaces disturbs the motion of nearby trapped
ions, compromising the fidelity of gate operations that are the basis for
quantum computing algorithms. We present a method that predicts the effect of
dielectric materials on the ion's motion. Such dielectrics are integral
components of ion traps. Quantitative agreement is found between a model with
no free parameters and measurements of a trapped ion in proximity to dielectric
mirrors. We expect that this approach can be used to optimize the design of
ion-trap-based quantum computers and network nodes.
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