Heating of a trapped ion induced by dielectric materials

• URL: http://arxiv.org/abs/2103.13846v1
• Date: Thu, 25 Mar 2021 13:52:28 GMT
• Title: Heating of a trapped ion induced by dielectric materials
• Authors: Markus Teller, Dario A. Fioretto, Philip C. Holz, Philipp Schindler, Viktor Messerer, Klemens Sch\"uppert, Yueyang Zou, Rainer Blatt, John Chiaverini, Jeremy Sage, Tracy E. Northup
• Abstract summary: Electric-field noise due to surfaces disturbs the motion of nearby trapped ions. We present a method that predicts the effect of dielectric materials on the ion's motion. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.
• Score: 1.2495977992702094
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ion's motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.

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