Harvesting data revolution for transmission electron microscopy (TEM)
using signal processing
- URL: http://arxiv.org/abs/2104.08688v1
- Date: Sun, 18 Apr 2021 02:56:04 GMT
- Title: Harvesting data revolution for transmission electron microscopy (TEM)
using signal processing
- Abstract summary: TEM (Transmission Electron Microscopy) is a powerful tool for imaging material structure and characterizing material chemistry.
Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate.
This challenge requires the development of new data processing tools, including image analysis, feature extraction, and streaming data processing techniques.
- Score: 8.228315909178573
- License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
- Abstract: TEM (Transmission Electron Microscopy) is a powerful tool for imaging
material structure and characterizing material chemistry. Recent advances in
data collection technology for TEM have enabled high-volume and high-resolution
data collection at a microsecond frame rate. This challenge requires the
development of new data processing tools, including image analysis, feature
extraction, and streaming data processing techniques. In this paper, we
highlight a few areas that have benefited from combining signal processing and
statistical analysis with data collection capabilities in TEM and present a
future outlook in opportunities of integrating signal processing with automated
TEM data analysis.
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