A Novel Fault-Tolerant Logic Style with Self-Checking Capability
- URL: http://arxiv.org/abs/2306.00844v1
- Date: Wed, 31 May 2023 12:21:53 GMT
- Title: A Novel Fault-Tolerant Logic Style with Self-Checking Capability
- Authors: Mahdi Taheri, Saeideh Sheikhpour, Ali Mahani, and Maksim Jenihhin
- Abstract summary: We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level.
The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of faulttolerant circuits.
- Score: 0.0
- License: http://creativecommons.org/licenses/by-nc-nd/4.0/
- Abstract: We introduce a novel logic style with self-checking capability to enhance
hardware reliability at logic level. The proposed logic cells have two-rail
inputs/outputs, and the functionality for each rail of outputs enables
construction of faulttolerant configurable circuits. The AND and OR gates
consist of 8 transistors based on CNFET technology, while the proposed XOR gate
benefits from both CNFET and low-power MGDI technologies in its transistor
arrangement. To demonstrate the feasibility of our new logic gates, we used an
AES S-box implementation as the use case. The extensive simulation results
using HSPICE indicate that the case-study circuit using on proposed gates has
superior speed and power consumption compared to other implementations with
error-detection capability
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