A Novel Fault-Tolerant Logic Style with Self-Checking Capability

• URL: http://arxiv.org/abs/2306.00844v1
• Date: Wed, 31 May 2023 12:21:53 GMT
• Title: A Novel Fault-Tolerant Logic Style with Self-Checking Capability
• Authors: Mahdi Taheri, Saeideh Sheikhpour, Ali Mahani, and Maksim Jenihhin
• Abstract summary: We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of faulttolerant circuits.
• Score: 0.0
• License: http://creativecommons.org/licenses/by-nc-nd/4.0/
• Abstract: We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of faulttolerant configurable circuits. The AND and OR gates consist of 8 transistors based on CNFET technology, while the proposed XOR gate benefits from both CNFET and low-power MGDI technologies in its transistor arrangement. To demonstrate the feasibility of our new logic gates, we used an AES S-box implementation as the use case. The extensive simulation results using HSPICE indicate that the case-study circuit using on proposed gates has superior speed and power consumption compared to other implementations with error-detection capability

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