Measuring error rates of mid-circuit measurements

• URL: http://arxiv.org/abs/2410.16706v1
• Date: Tue, 22 Oct 2024 05:22:43 GMT
• Title: Measuring error rates of mid-circuit measurements
• Authors: Daniel Hothem, Jordan Hines, Charles Baldwin, Dan Gresh, Robin Blume-Kohout, Timothy Proctor,
• Abstract summary: We introduce the first benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. We detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. We quantify how much of that error is eliminated by dynamical decoupling.
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• Abstract: High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits, and other paths to solving classically intractable problems. But there are almost no methods to assess their performance comprehensively. We address this gap by introducing the first randomized benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. Using this protocol, we detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same protocol to measure the rate of measurement-induced crosstalk error on a 27-qubit IBM Q processor, and quantify how much of that error is eliminated by dynamical decoupling.

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