On Quantum Reliability Characterizing Systematic Errors in Quantum Sensing

• URL: http://arxiv.org/abs/2410.20759v1
• Date: Mon, 28 Oct 2024 05:50:44 GMT
• Title: On Quantum Reliability Characterizing Systematic Errors in Quantum Sensing
• Authors: Lian-Xiang Cui, Yi-Mu Du, C. P. Sun,
• Abstract summary: We utilize quantum reliability as a metric to evaluate quantum sensor's performance based solely on the apparatus itself. We derive a general relationship among reliability, sensitivity, and systematic error, and demonstrate this relationship using a typical quantum sensing process.
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• Abstract: Quantum sensing utilize quantum effects, such as entanglement and coherence, to measure physical signals. The performance of a sensing process is characterized by error which requires comparison to a true value. However, in practice, such a true value might be inaccessible. In this study, we utilize quantum reliability as a metric to evaluate quantum sensor's performance based solely on the apparatus itself, without any prior knowledge of true value. We derive a general relationship among reliability, sensitivity, and systematic error, and demonstrate this relationship using a typical quantum sensing process. That is to measure magnetic fields (as a signal) by a spin-$1/2$ particle and using the Stern-Gerlach apparatus to read out the signal information. Our findings illustrate the application of quantum reliability in quantum sensing, opening new perspectives for reliability analysis in quantum systems.

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