SuperAD: A Training-free Anomaly Classification and Segmentation Method for CVPR 2025 VAND 3.0 Workshop Challenge Track 1: Adapt & Detect

• URL: http://arxiv.org/abs/2505.19750v2
• Date: Tue, 27 May 2025 11:09:08 GMT
• Title: SuperAD: A Training-free Anomaly Classification and Segmentation Method for CVPR 2025 VAND 3.0 Workshop Challenge Track 1: Adapt & Detect
• Authors: Huaiyuan Zhang, Hang Chen, Yu Cheng, Shunyi Wu, Linghao Sun, Linao Han, Zeyu Shi, Lei Qi,
• Abstract summary: We propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD.<n>Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.
• Score: 17.160007050126403
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: In this technical report, we present our solution to the CVPR 2025 Visual Anomaly and Novelty Detection (VAND) 3.0 Workshop Challenge Track 1: Adapt & Detect: Robust Anomaly Detection in Real-World Applications. In real-world industrial anomaly detection, it is crucial to accurately identify anomalies with physical complexity, such as transparent or reflective surfaces, occlusions, and low-contrast contaminations. The recently proposed MVTec AD 2 dataset significantly narrows the gap between publicly available benchmarks and anomalies found in real-world industrial environments. To address the challenges posed by this dataset--such as complex and varying lighting conditions and real anomalies with large scale differences--we propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD. Our method carefully selects a small number of normal reference images and constructs a memory bank by leveraging the strong representational power of DINOv2. Anomalies are then segmented by performing nearest neighbor matching between test image features and the memory bank. Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.

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