A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning

• URL: http://arxiv.org/abs/2509.20946v1
• Date: Thu, 25 Sep 2025 09:29:20 GMT
• Title: A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning
• Authors: Dongqi Zheng, Wenjin Fu, Guangzong Chen,
• Abstract summary: The system employs an unsupervised anomaly detection framework that trains exclusively on good'' sensor images to learn normal coating distribution patterns.<n>The system provides potential annual cost savings through automated quality control and processing times of 0.5 seconds per image in on-device implementation.
• Score: 1.1470070927586018
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that can compromise laser energy measurement accuracy in medical and industrial applications. The system employs an unsupervised anomaly detection framework that trains exclusively on ``good'' sensor images to learn normal coating distribution patterns, enabling detection of both known and novel defect types without requiring extensive labeled defect datasets. Our methodology consists of three key components: (1) a robust preprocessing pipeline using Laplacian edge detection and K-means clustering to segment the area of interest, (2) synthetic data augmentation via StyleGAN2, and (3) a UFlow-based neural network architecture for multi-scale feature extraction and anomaly map generation. Experimental evaluation on 366 real sensor images demonstrates $93.8\%$ accuracy on defective samples and $89.3\%$ accuracy on good samples, with image-level AUROC of 0.957 and pixel-level AUROC of 0.961. The system provides potential annual cost savings through automated quality control and processing times of 0.5 seconds per image in on-device implementation.

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