Full-permutation dynamical decoupling in triple-quantum-dot spin qubits

• URL: http://arxiv.org/abs/2208.11784v2
• Date: Wed, 7 Sep 2022 23:55:00 GMT
• Title: Full-permutation dynamical decoupling in triple-quantum-dot spin qubits
• Authors: Bo Sun, Teresa Brecht, Bryan Fong, Moonmoon Akmal, Jacob Z. Blumoff, Tyler A. Cain, Faustin W. Carter, Dylan H. Finestone, Micha N. Fireman, Wonill Ha, Anthony T. Hatke, Ryan M. Hickey, Clayton A. C. Jackson, Ian Jenkins, Aaron M. Jones, Andrew Pan, Daniel R. Ward, Aaron J. Weinstein, Samuel J. Whiteley, Parker Williams, Matthew G. Borselli, Matthew T. Rakher and Thaddeus D. Ladd
• Abstract summary: We show a technique that cyclically exchanges the spins in a triple-dot qubit. This sequence suppresses both low frequency charge-noise and magnetic-noise-induced errors. We experimentally validate an error model that includes $1/f$ charge noise and $1/f$ magnetic noise.
• Score: 1.473520625727543
• License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
• Abstract: Dynamical decoupling of spin qubits in silicon can enhance fidelity and be used to extract the frequency spectra of noise processes. We demonstrate a full-permutation dynamical decoupling technique that cyclically exchanges the spins in a triple-dot qubit. This sequence not only suppresses both low frequency charge-noise- and magnetic-noise-induced errors; it also refocuses leakage errors to first order, which is particularly interesting for encoded exchange-only qubits. For a specific construction, which we call NZ1y, the qubit is isolated from error sources to such a degree that we measure a remarkable exchange pulse error of $5\times10^{-5}$. This sequence maintains a quantum state for roughly 18,000 exchange pulses, extending the qubit coherence from $T_2^*=2~\mu$s to $T_2 = 720~\mu$s. We experimentally validate an error model that includes $1/f$ charge noise and $1/f$ magnetic noise in two ways: by direct exchange-qubit simulation, and by integration of the assumed noise spectra with derived filter functions, both of which reproduce the measured error and leakage with respect to changing the repetition rate.

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