Reflective Dielectric Cavity Enhanced Emission from Hexagonal Boron
Nitride Spin Defect Arrays
- URL: http://arxiv.org/abs/2209.00256v1
- Date: Thu, 1 Sep 2022 06:34:31 GMT
- Title: Reflective Dielectric Cavity Enhanced Emission from Hexagonal Boron
Nitride Spin Defect Arrays
- Authors: Xiao-Dong Zeng, Yuan-Ze Yang, Nai-Jie Guo, Zhi-Peng Li, Zhao-An Wang,
Lin-Ke Xie, Shang Yu, Yu Meng, Qiang Li, Jin-Shi Xu, Wei Liu, Yi-Tao Wang,
Jian-Shun Tang, Chuan-Feng Li, Guang-Can Guo
- Abstract summary: We demonstrate a robust enhancement structure with advantages including easy on-chip integration, convenient processing, low cost and suitable broad-spectrum enhancement.
We achieved a PL enhancement of approximately 7-fold, and the corresponding ODMR contrast achieved 18%.
This work has guiding significance for realizing the on-chip integration of spin defects in two-dimensional materials.
- Score: 10.645484240543327
- License: http://creativecommons.org/licenses/by/4.0/
- Abstract: Among the various kinds of spin defects in hBN, the negatively charged boron
vacancy ($\rm V_B^-$) spin defect that can be deterministically generated is
undoubtedly a potential candidate for quantum sensing, but its low quantum
efficiency restricts its %use in practical applications. Here, we demonstrate a
robust enhancement structure with advantages including easy on-chip
integration, convenient processing, low cost and suitable broad-spectrum
enhancement for $\rm V_B^-$ defects. %Improved photoluminescence (PL) intensity
and optically detected magnetic resonance (ODMR) contrast of $\rm V_B^-$ defect
arrays. In the experiment, we used a metal reflective layer under the hBN
flakes, filled with a transition dielectric layer in the middle, and adjusted
the thickness of the dielectric layer to achieve the best coupling between the
reflective dielectric cavity and the hBN spin defect. Using a reflective
dielectric cavity, we achieved a PL enhancement of approximately 7-fold, and
the corresponding ODMR contrast achieved 18\%. Additionally, the oxide layer of
the reflective dielectric cavity can be used as an integrated material for
micro-nano photonic devices for secondary processing, which means that it can
be combined with other enhancement structures to achieve stronger enhancement.
This work has guiding significance for realizing the on-chip integration of
spin defects in two-dimensional materials.
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