Coherence spectroscopy by the Nth power of the measured signal in an interferometer overcoming the diffraction limit

• URL: http://arxiv.org/abs/2405.12482v1
• Date: Tue, 21 May 2024 04:04:52 GMT
• Title: Coherence spectroscopy by the Nth power of the measured signal in an interferometer overcoming the diffraction limit
• Authors: Byoung S. Ham,
• Abstract summary: Coherence spectroscopy has been intensively studied over the last several decades for various applications in science and engineering. Here, the Kth power of the measured signal in an N-slit interferometer is studied for enhanced coherence spectroscopy to overcome the resolution limit of the original system. The Kth power of the intensity beats the resolution limit of the N-slit interferometer, in which the out-of-shelf spectrometer or wavelength meter can be a primary beneficiary.
• Score: 0.0
• License: http://creativecommons.org/licenses/by/4.0/
• Abstract: Coherence spectroscopy has been intensively studied over the last several decades for various applications in science and engineering. The Rayleigh criterion defines the resolution limit of an interferometer, where many-wave interference beats the resolution limit of a two-slit system. On the other hand, the diffraction angle in a slit is reduced by the Kth power of the measured signal, resulting in the shot-noise limit. Here, the Kth power of the measured signal in an N-slit interferometer is studied for enhanced coherence spectroscopy to overcome the resolution limit of the original system. The Kth power to the individual intensities of the N-slit interferometer is numerically demonstrated for enhanced resolution satisfying the shot-noise limit. As a result, the Kth power of the intensity beats the resolution limit of the N-slit interferometer, in which the out-of-shelf spectrometer or wavelength meter can be a primary beneficiary of this technique. Due to the same resolution of the Heisenberg limit in quantum sensing as in the N-slit interference fringe, the proposed Kth power technique also beats the superresolution in quantum metrology.

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